John Unguris, Ph.D. 1980, wins APS 2015 Joseph F. Keithley Award for Advances in Measurement Science

For the invention and development of electron spin sources and detectors, and their application to measurement science.

John Unguris received a B.S. in Physics from Carnegie Mellon University in 1973, and a Ph.D. in Physics from the University of Wisconsin in 1980. He initially joined the National Institute of Standards and Technology (NIST) as a National Research Council Postdoctoral Research Associate investigating the application of electron spin measurements to various surface sensitive spectroscopies. This work lead to the development of an electron microscopy technique for directly imaging magnetic nanostructures, Scanning Electron Microscopy with Polarization Analysis (SEMPA). He has since used SEMPA to measure the magnetic properties of a wide variety of structures including ultrathin patterned magnetic films, oscillatory exchange coupled magnetic multilayers, and multiferroic heterostructures. He is currently a Project Leader in the Electron Physics Group in the Center for Nanoscale Science and Technology, where he is leading multiple projects investigating the fundamental physics of magnetic nanostructures. He is a Fellow of the American Physical Society, and has been awarded a Bronze Medal from the Department of Commerce, and is a member of AVS and APS.